ALSAYGH, Zaid; AL-AMEEN, Zohair. CONTRAST ENHANCEMENT OF SCANNING ELECTRON MICROSCOPY IMAGES USING A NONCOMPLEX MULTIPHASE ALGORITHM. Applied Computer Science, [S. l.], v. 18, n. 2, p. 28–42, 2022. DOI: 10.35784/acs-2022-11. Disponível em: https://ph.pollub.pl/index.php/acs/article/view/3343. Acesso em: 19 dec. 2024.