[1]
Kychak, V. et al. 2020. INCREASING RADIATION RESISTANCE OF MEMORY DEVICES BASED ON AMORPHOUS SEMICONDUCTORS. Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska. 10, 3 (Sep. 2020), 78–81. DOI:https://doi.org/10.35784/iapgos.2081.