KYCHAK, Vasyl; SLOBODIAN, Ivan; VOVK, Victor. INCREASING RADIATION RESISTANCE OF MEMORY DEVICES BASED ON AMORPHOUS SEMICONDUCTORS. Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, [S. l.], v. 10, n. 3, p. 78–81, 2020. DOI: 10.35784/iapgos.2081. Disponível em: https://ph.pollub.pl/index.php/iapgos/article/view/2081. Acesso em: 26 apr. 2024.