KOVALEV, Vladimir; UVAYSOV, Saygid; BOGUCKI, Marcin. ELLIPSOMETRY BASED SPECTROSCOPIC COMPLEX FOR RAPID ASSESSMENT OF THE Bi2Te3-xSex THIN FILMS COMPOSITION. Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, [S. l.], v. 11, n. 4, p. 67–74, 2021. DOI: 10.35784/iapgos.2855. Disponível em: https://ph.pollub.pl/index.php/iapgos/article/view/2855. Acesso em: 23 apr. 2024.