DIGITAL CONTACT POTENTIAL PROBE IN STUDYING THE DEFORMATION OF DIELECTRIC MATERIALS
Kanstantsin Pantsialeyeu
k.pantsialeyeu@bntu.byBelarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0001-7113-1815
Anatoly Zharin
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0001-7213-4532
Oleg Gusev
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0001-5180-1121
Roman Vorobey
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0003-2851-6108
Andrey Tyavlovsky
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0003-2579-1016
Konstantin Tyavlovsky
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0001-8020-0165
Aliaksandr Svistun
Belarusian National Technical University, Instrumentation Engineering Faculty (Belarus)
http://orcid.org/0000-0002-9593-8880
Abstract
The paper reviews the results of a study on the surface electrostatic charges of dielectrics obtained using the contact potential difference (CPD) technique. Initially, the CPD technique was only applied to the study of metal and semiconductor surfaces. The conventional CPD measurement technique requires full compensation of the measured potential that, in the case of dielectrics, could reach very high values. Such high potentials are hard to compensate. Therefore, the conventional CPD method is rarely applied in the study of dielectric materials. Some important improvements recently made to the CPD measurement technique removed the need for compensation. The new method, which does not require compensation, has been implemented in the form of a digital Kelvin probe. The paper describes the principles of the non-compensation CPD measurement technique which was developed for mapping the electrostatic surface charge space distribution across a wide range of potential values. The study was performed on polymers such as low-density polyethylene (LDPE) and polytetrafluoroethylene (PTFE).
Keywords:
surface charge distribution, contact potential difference, Scanning Kelvin Probe, dielectrics materialsReferences
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Authors
Kanstantsin Pantsialeyeuk.pantsialeyeu@bntu.by
Belarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0001-7113-1815
Authors
Anatoly ZharinBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0001-7213-4532
Authors
Oleg GusevBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0001-5180-1121
Authors
Roman VorobeyBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0003-2851-6108
Authors
Andrey TyavlovskyBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0003-2579-1016
Authors
Konstantin TyavlovskyBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0001-8020-0165
Authors
Aliaksandr SvistunBelarusian National Technical University, Instrumentation Engineering Faculty Belarus
http://orcid.org/0000-0002-9593-8880
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