DETERMINATION OF THE OPTIMAL FREQUENCY OF THE PRIMARY MEASURING TRANSDUCER OF THE THICKNESS OF DIELECTRIC COATINGS OF METAL SURFACES

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DOI

Kostyantyn Ovchynnykov

ovkos1980@gmail.com

http://orcid.org/0000-0003-4685-1137
Oleksandr Vasilevskyi

o.vasilevskyi@gmail.com

http://orcid.org/0000-0002-8618-0377
Volodymyr Sevastianov

sevastiyanov.vladimir@vntu.edu.ua

Yurii Polievoda

vinyura36@gmail.com

http://orcid.org/0000-0002-2485-0611
Aliya Kalizhanova

kalizhanova_aliya@mail.ru

http://orcid.org/0000-0002-5979-9756
Bakhyt Yeraliyeva

yeraliyevabakhyt81@gmail.com

http://orcid.org/0000-0002-8680-7694

Abstract

The article provides an analysis of the physical processes underlying the operation of the measuring transducer, with a time based information presentation. A mathematical model is developed that describes the process of free oscillation attenuation excited in the LC-contour of primary measuring transducer, and analyzes and evaluates the influence of external factors that influence the measurement results. The ways of elimination of their influence on the results of measuring control are offered.

Keywords:

measuring, transducer, thickness, dielectric coating, metal surface, oscillation

References

Article Details

Ovchynnykov, K., Vasilevskyi, O. ., Sevastianov, V., Polievoda, Y. ., Kalizhanova, A., & Yeraliyeva, B. (2022). DETERMINATION OF THE OPTIMAL FREQUENCY OF THE PRIMARY MEASURING TRANSDUCER OF THE THICKNESS OF DIELECTRIC COATINGS OF METAL SURFACES. Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska, 12(2), 56–59. https://doi.org/10.35784/iapgos.2948