ZASTOSOWANIE METODY POCHODNEJ TOPOLOGICZNEJ W ELEKTRYCZNEJ TOMOGRAFII IMPEDANCYJNEJ

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Novotny A.A., Feijóo R.A., Padra C., Taroco E.: Topological sensitivity analysis. Computer Methods in Applied Mechanics and Engineering 192(7–8), 2003, 803–829.
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Novotny A.A., Feijóo R.A., Taroco E., Padra C.: Topological sensitivity analysis for three dimensional linear elasticity problem. Computer Methods in Applied Mechanics and Engineering 196(41–44), 2007, 4354–4364.
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Novotny A.A., Sokołowski J.: Topological derivatives in shape optimization. Interaction of Mechanics and Mathematics. Springer-Verlag, Berlin, Heidelberg 2013.
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Novotny A.A., Sokołowski J., de Souza Neto E.A.: Topological sensitivity analysis of a multiscale constitutive model considering a cracked microstructure. Mathematical Methods in the Applied Sciences 33(5), 2010, 676–686.
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Sankowski D., Sikora J.: Electrical Capacitance Tomography: Theoretical Basis and Applications. Electrotechnical Institute, Poland, Miedzylesie 2010.
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Sikora J.: Boundary Element Method for Impedance and Optical Tomography. Oficyna Wydawnicza Politechniki Warszawskiej, Poland, Warsaw 2007.
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Sikora J., Wójtowicz S.: Industrial and Biological Tomography: Theoretical Basis and Applications. Electrotechnical Institute, Poland, Miedzylesie 2010.
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Sokołowski J., Żochowski A.: Optimality conditions for simultaneous topology and shape optimization. SIAM Journal on Control and Optimization 42(4), 2003, 1198–1221.
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Van Goethem N., Novotny A.A.: Crack nucleation sensitivity analysis. Mathematical Methods in the Applied Sciences 33(16), 2010, 1978–1994.
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