Chemical composition, structural and electrical properties of CdZnTeSe thick polycrystalline films
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Main Article Content
Authors
yaroslav.znamenshchykov@gmail.com
Abstract
Thick polycrystalline Cd₁₋ₓZnₓTe₁₋ᵧSeᵧ (CZTS) films were synthesized via the close-spaced vacuum sublimation (CSVS) technique. Comprehensive investigations of their structural, compositional, and electrical properties were performed to assess their suitability as base layers for X-ray detector applications. The films were characterized using scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), and X-ray diffraction (XRD). Morphological and structural analyses revealed uniform composition, dense microstructure, and high crystalline quality of the films deposited on glass substrates. Electrical and photosensitivity measurements demonstrated that detector prototypes incorporating CZTS films exhibit pronounced photoresponse under light illumination, confirming their potential for use in next-generation X-ray detection devices.
Keywords:
References
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