Chemical composition, structural and electrical properties of CdZnTeSe thick polycrystalline films

Main Article Content

Yaroslav Znamenshchykov

yaroslav.znamenshchykov@gmail.com

https://orcid.org/0000-0002-6866-0414
Oleksii Lisovenko

alexsumy87@ukr.net

Mykola Khvyshchun

mykolaxmv@ukr.net

https://orcid.org/0000-0002-3918-4527
Anatoliy Opanasyuk

a.opanasyuk@ekt.sumdu.edu.ua

https://orcid.org/0000-0002-1888-3935

Abstract

Thick polycrystalline Cd₁₋ₓZnₓTe₁₋ᵧSeᵧ (CZTS) films were synthesized via the close-spaced vacuum sublimation (CSVS) technique. Comprehensive investigations of their structural, compositional, and electrical properties were performed to assess their suitability as base layers for X-ray detector applications. The films were characterized using scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), and X-ray diffraction (XRD). Morphological and structural analyses revealed uniform composition, dense microstructure, and high crystalline quality of the films deposited on glass substrates. Electrical and photosensitivity measurements demonstrated that detector prototypes incorporating CZTS films exhibit pronounced photoresponse under light illumination, confirming their potential for use in next-generation X-ray detection devices.

Keywords:

CdZnTeSe, Thick films, Close-spaced vacuum sublimation, Crystal structure, Photosensitivity, X-ray detector

References

Article Details

Znamenshchykov, Y., Lisovenko, O., Khvyshchun, M., & Opanasyuk, A. (2026). Chemical composition, structural and electrical properties of CdZnTeSe thick polycrystalline films. Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska, 16(2), 126–130. https://doi.org/10.35784/iapgos.7435