LOW POWER PROTOTYPE OF THE INTEGRATED CIRCUIT WITH DUAL-STAGE PULSE PROCESSING FOR TIME AND AMPLITUDE MEASUREMENT


Abstract

This paper presents the prototype of the application specific integrated circuit designed for a silicon detector with large capacitance. The measured quantities are: the interaction time and the deposited charge. The aim of this project is to observe the influence of increasing sensor capacitance (up to tens of pF) on operation and performance of the dual-stage analog front-end electronics based on the concept of the Time-over-Threshold processing method.


Keywords

application specific integrated circuits; semiconductor detectors; charge-sensitive amplifiers

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Kasiński K., Kłeczek R., Gryboś P., Szczygieł R.: Time-over-Threshold processing implementation for silicon detectors with large capacitances. Proceedings of IEEE Nuclear Science Symposium and Medical Imaging Conference, 2012, Anaheim, California, USA, s. 884-885.

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Published : 2014-03-12


Kasiński, K., & Kłeczek, R. (2014). LOW POWER PROTOTYPE OF THE INTEGRATED CIRCUIT WITH DUAL-STAGE PULSE PROCESSING FOR TIME AND AMPLITUDE MEASUREMENT. Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska, 4(1), 72-75. https://doi.org/10.5604/20830157.1093213

Krzysztof Kasiński  krzysztof.kasinski@agh.edu.pl
AGH University of Science and Technology  Poland
Rafał Kłeczek 
AGH University of Science and Technology  Poland