OVERVIEW OF THE USE OF X-RAY EQUIPMENT IN ELECTRONICS QUALITY TESTS

Magdalena Michalska

doi:10.35784/iapgos.2655

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Published: Jun 30, 2021

DOI: https://doi.org/10.35784/iapgos.2655

Issue Vol. 11 No. 2 (2021)

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OVERVIEW OF THE USE OF X-RAY EQUIPMENT IN ELECTRONICS QUALITY TESTS
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BROADBAND SATELLITE DATA NETWORKS IN THE CONTEXT OF AVAILABLE PROTOCOLS AND DIGITAL PLATFORMS
ENGLISH
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DOI

https://doi.org/10.35784/iapgos.2655

Authors

Magdalena Michalska

mmagamichalska@gmail.com

Lublin University of Technology, Faculty of Electrical Engineering and Computer Science, Poland

http://orcid.org/0000-0002-0874-3285

Abstract

Surface-mount technology is now widely used in the production of many components. The development of the miniaturised electronics industry forces the development of increasingly accurate inspection methods. X-ray and computed tomography are methods to accurately assess the quality of a circuit board. The article discusses the basics of image formation of the tested electronics, the development of the design of the devices used and examples of x-ray, computed tomography applications.

Keywords:

defect inspection, electronic components, industrial radioscopic systems, X-ray, computed tomography

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Michalska, M. (2021). OVERVIEW OF THE USE OF X-RAY EQUIPMENT IN ELECTRONICS QUALITY TESTS. Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska, 11(2), 26–29. https://doi.org/10.35784/iapgos.2655

OVERVIEW OF THE USE OF X-RAY EQUIPMENT IN ELECTRONICS QUALITY TESTS

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