DETERMINATION OF THE OPTIMAL FREQUENCY OF THE PRIMARY MEASURING TRANSDUCER OF THE THICKNESS OF DIELECTRIC COATINGS OF METAL SURFACES

University of Power Engineering and Telecommunications; Institute of Information and Computational Technologies of the Ministry of Education and Science CS of the Republic of Kazakhstan, Kazachstan

http://orcid.org/0000-0002-5979-9756

Bakhyt Yeraliyeva

yeraliyevabakhyt81@gmail.com

M. Kh. Dulaty Taraz Regional University, Kazachstan

http://orcid.org/0000-0002-8680-7694

Abstrakt

Artykuł zawiera analizę procesów fizycznych leżących u podstaw pracy przetwornika pomiarowego wraz z prezentacją informacji w czasie. Opracowano model matematyczny opisujący proces tłumienia drgań swobodnych wzbudzanych w obwodzie LC głównego przetwornika pomiarowego, analizujący i oceniający wpływ czynników zewnętrznych na wyniki pomiarów. Proponowane są sposoby wyeliminowania ich wpływu na wyniki kontroli pomiarów.

Słowa kluczowe:

pomiar, przetwornik, grubość, powłoka dielektryczna, powierzchnia metalowa, oscylacje

Bibliografia

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Numer Tom 12 Nr 2 (2022)

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