Chemical composition, structural and electrical properties of CdZnTeSe thick polycrystalline films

Grube polikrystaliczne warstwy Cd₁₋ₓZnₓTe₁₋ᵧSeᵧ (CZTS) zsyntetyzowano techniką sublimacji próżniowej w małych przestrzeniach (CSVS). Przeprowadzono kompleksowe badania ich właściwości strukturalnych, kompozycyjnych i elektrycznych, aby ocenić ich przydatność jako warstw bazowych do zastosowań w detektorach promieniowania rentgenowskiego. Warstwy scharakteryzowano za pomocą skaningowej mikroskopii elektronowej (SEM), spektroskopii rentgenowskiej z dyspersją energii (EDS) oraz dyfrakcji rentgenowskiej (XRD). Analizy morfologiczne i strukturalne wykazały jednorodny skład, gęstą mikrostrukturę i wysoką jakość krystaliczną warstw osadzonych na podłożach szklanych. Pomiary elektryczne i światłoczułości wykazały, że prototypy detektorów zawierające warstwy CZTS wykazują wyraźną fotoreakcję pod wpływem światła, co potwierdza ich potencjał do zastosowania w urządzeniach do detekcji promieniowania rentgenowskiego nowej generacji.

Słowa kluczowe:

CdZnTeSe, grube warstwy, sublimacja próżniowa w małej odległości, struktura krystaliczna, czułość na światło, detektor promieniowania rentgenowskiego

Bibliografia

[1] Arashti, M. G., Hasani, E., Kamalian, M., & Habashi, L. B. (2023). Effect of substrate type on the physical properties of thermally evaporated CdS thin films for CdTe/CdS solar cells applications. Physica Scripta, 98(6), 065403. https://doi.org/10.1088/1402-4896/acd485

[2] Burany, S. (2003). Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9. Microscopy and Microanalysis, 9(5), 484–484. https://doi.org/10.1017/S1431927603030617

[3] Bushroa, A. R., Rahbari, R. G., Masjuki, H. H., & Muhamad, M. R. (2012). Approximation of crystallite size and microstrain via XRD line broadening analysis in TiSiN thin films. Vacuum, 86(8), 1107–1112. https://doi.org/10.1016/j.vacuum.2011.10.011

[4] Cao, M., Xu, Z., He, W., Zhang, Z., Wang, Z., Hu, Q., Huang, J., & Wang, L. (2025). Enhanced photoelectrochemistry properties of CdZnTeSe thin films. Applied Surface Science, 680, 161372. https://doi.org/10.1016/j.apsusc.2024.161372

[5] Chaudhuri, S. K., Sajjad, M., Kleppinger, J. W., & Mandal, K. C. (2020). Charge transport properties in CdZnTeSe semiconductor room-temperature γ -ray detectors. Journal of Applied Physics, 127(24), 245706. https://doi.org/10.1063/5.0006227

[6] Del Sordo, S., Abbene, L., Caroli, E., Mancini, A. M., Zappettini, A., & Ubertini, P. (2009). Progress in the Development of CdTe and CdZnTe Semiconductor Radiation Detectors for Astrophysical and Medical Applications. Sensors, 9(5), 3491–3526. https://doi.org/10.3390/s90503491

[7] Egarievwe, S. U., Roy, U. N., Harrison, B. A., Goree, C. A., Savage, E. K., Jones, J., & James, R. B. (2019). Fabrication and Characterization of CdZnTeSe Nuclear Detectors. 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 1–3. https://doi.org/10.1109/NSS/MIC42101.2019.9059726

[8] Fiederle, M., Feltgen, T., Meinhardt, J., Rogalla, M., & Benz, K. W. (1999). State of the art of (Cd,Zn)Te as gamma detector. Journal of Crystal Growth, 197(3), 635–640. https://doi.org/10.1016/S0022-0248(98)00761-1

[9] Gnatenko, Yu. P., Bukivskij, P. M., Faryna, I. O., Opanasyuk, A. S., & Ivashchenko, M. M. (2014). Photoluminescence of high optical quality CdSe thin films deposited by close-spaced vacuum sublimation. Journal of Luminescence, 146, 174–177. https://doi.org/10.1016/j.jlumin.2013.09.070

[10] Hannachi, L., & Bouarissa, N. (2008). Electronic structure and optical properties of CdSexTe1−x mixed crystals. Superlattices and Microstructures, 44(6), 794–801. https://doi.org/10.1016/j.spmi.2008.09.013

[11] Hossain, A., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Gul, R., Roy, U. N., Yang, G., & James, R. B. (2017). Direct observation of influence of secondary-phase defects on CZT detector response. Journal of Crystal Growth, 470, 99–103. https://doi.org/10.1016/j.jcrysgro.2017.04.002

[12] Huang, J., Gu, Q., Yang, F., Tang, K., Gou, S., Zhang, Z., Shen, Y., Zhang, J., Wang, L., & Lu, Y. (2019). Growth and properties of CdZnTe films on different substrates. Surface and Coatings Technology, 364, 444–448. https://doi.org/10.1016/j.surfcoat.2018.10.083

[13] Johns, P. M., & Nino, J. C. (2019). Room temperature semiconductor detectors for nuclear security. Journal of Applied Physics, 126(4), 040902. https://doi.org/10.1063/1.5091805

[14] Kang, S., Jung, B., Noh, S., Cho, C., Yoon, I., & Park, J. (2012). Feasibility study of direct-conversion x-ray detection using cadmium zinc telluride films. Journal of Instrumentation, 7(01), C01010–C01010. https://doi.org/10.1088/1748-0221/7/01/C01010

[15] Liang, X. Y., Min, J. H., Chen, J., Wang, D., Li, H., Wang, Y., Wang, L. J., & Zhang, J. J. (2012). Metal/Semiconductor Contacts for Schottky and Photoconductive CdZnTe Detector. Physics Procedia, 32, 545–550. https://doi.org/10.1016/j.phpro.2012.03.599

[16] Mathy, F., Gliere, A., d’Aillon, E. G., Masse, P., Picone, M., Tabary, J., & Verger, L. (2004). A three-dimensional model of CdZnTe gamma-ray detector and its experimental validation. IEEE Transactions on Nuclear Science, 51(5), 2419–2426. https://doi.org/10.1109/TNS.2004.835906

[17] Opanasyuk, A., Kurbatov, D., Znamenshchykov, Ya., Diachenko, O., & Ivashchenko, M. (2023). CdTe-/CdZnTe-Based Radiation Detectors. In G. Korotcenkov (Ed.), Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors (pp. 35–73). Springer International Publishing. https://doi.org/10.1007/978-3-031-24000-3_2

[18] Opanasyuk, A. S., Kurbatov, D. I., Kosyak, V. V., Kshniakina, S. I., & Danilchenko, S. N. (2012). Characteristics of structure formation in zinc and cadmium chalcogenide films deposited on nonorienting substrates. Crystallography Reports, 57(7), 927–933. https://doi.org/10.1134/S1063774512070206

[19] Prabakar, K., Venkatachalam, S., Jeyachandran, Y. L., Narayandass, Sa. K., & Mangalaraj, D. (2004). Microstructure, Raman and optical studies on Cd0.6Zn0.4Te thin films. Materials Science and Engineering: B, 107(1), 99–105. https://doi.org/10.1016/j.mseb.2003.10.017

[20] Roy, U. N., Camarda, G. S., Cui, Y., Gul, R., Hossain, A., Yang, G., Zazvorka, J., Dedic, V., Franc, J., & James, R. B. (2019). Role of selenium addition to CdZnTe matrix for room-temperature radiation detector applications. Scientific Reports, 9(1), 1620. https://doi.org/10.1038/s41598-018-38188-w

[21] Roy, U. N., Camarda, G. S., Cui, Y., & James, R. B. (2020). X-ray topographic study of Bridgman-grown CdZnTeSe. Journal of Crystal Growth, 546, 125753. https://doi.org/10.1016/j.jcrysgro.2020.125753

[22] Roy, U. N., Camarda, G. S., Cui, Y., & James, R. B. (2023). Growth interface study of CdTeSe crystals grown by the THM technique. Journal of Crystal Growth, 616, 127261. https://doi.org/10.1016/j.jcrysgro.2023.127261

[23] Schlesinger, T. E., Toney, J. E., Yoon, H., Lee, E. Y., Brunett, B. A., Franks, L., & James, R. B. (2001). Cadmium zinc telluride and its use as a nuclear radiation detector material. Materials Science and Engineering: R: Reports, 32(4–5), 103–189. https://doi.org/10.1016/S0927-796X(01)00027-4

[24] Sellin, P. J. (2006). Thick film compound semiconductors for X-ray imaging applications. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 563(1), 1–8. https://doi.org/10.1016/j.nima.2006.01.110

[25] Stolyarova, S., Edelman, F., Chack, A., Berner, A., Werner, P., Zakharov, N., Vytrykhivsky, M., Beserman, R., Weil, R., & Nemirovsky, Y. (2008). Structure of CdZnTe films on glass. Journal of Physics D: Applied Physics, 41(6), 065402. https://doi.org/10.1088/0022-3727/41/6/065402

[26] Takahashi, J., Mochizuki, K., Hitomi, K., & Shoji, T. (2004). Growth of Cd1−xZnxTe(x∼0.04) films by hot-wall method and its evaluation. Journal of Crystal Growth, 269(2–4), 419–424. https://doi.org/10.1016/j.jcrysgro.2004.05.054

[27] Tokuda, S., Kishihara, H., Adachi, S., & Sato, T. (2004). Preparation and characterization of polycrystalline CdZnTe films for large-area, high-sensitivity X-ray detectors. Journal of Materials Science: Materials in Electronics, 15(1), 1–8. https://doi.org/10.1023/A:1026297416093

[28] Triboulet, R., & Siffert, P. (2010). Foreword. In CdTe and Related Compounds; Physics, Defects, Hetero- and Nano-structures, Crystal Growth, Surfaces and Applications (p. xi). Elsevier. https://doi.org/10.1016/B978-0-08-046409-1.00012-5

[29] Verger, L., Bonnefoy, J. P., Glasser, F., & Ouvrier-Buffet, P. (1997). New developments in CdTe and CdZnTe detectors for X and γ-ray applications. Journal of Electronic Materials, 26(6), 738–744. https://doi.org/10.1007/s11664-997-0225-2

[30] Vieira, N. C. S., Fernandes, E. G. R., Queiroz, A. A. A. D., Guimarães, F. E. G., & Zucolotto, V. (2013). Indium tin oxide synthesized by a low cost route as SEGFET pH sensor. Materials Research, 16(5), 1156–1160. https://doi.org/10.1590/S1516-14392013005000101

[31] Warren, B. E. (2012). X-Ray Diffraction. Dover Publications, Inc.

[32] Yang, G., Bolotnikov, A. E., Cui, Y., Camarda, G. S., Hossain, A., Kim, K. H., Franc, J., Belas, E., & James, R. B. (2013). Low-Temperature Photoluminescence Study of CdTe:In Crystals Annealed in Molten Bismuth. Journal of Electronic Materials, 42(11), 3138–3141. https://doi.org/10.1007/s11664-013-2683-z

[33] Yang, G., & James, R. B. (2010). Applications of CdTe, CdZnTe, and CdMnTe Radiation Detectors. In R. Triboulet, P. Siffert (Eds.), CdTe and Related Compounds; Physics, Defects, Hetero- and Nano-structures, Crystal Growth, Surfaces and Applications (pp. 214–238). Elsevier. https://doi.org/10.1016/B978-0-08-096513-0.00002-9

[34] Zhang, Y., Wang, L., Xu, R., Huang, J., Tao, J., Meng, H., Zhang, J., & Min, J. (2016). A novel intermediate layer for Au/CdZnTe/FTO photoconductive structure. Applied Surface Science, 388, 589–592. https://doi.org/10.1016/j.apsusc.2015.09.194

[35] Zou, J., Fauler, A., Senchenkov, A. S., Kolesnikov, N. N., Kirste, L., Kabukcuoglu, M. Pinar., Hamann, E., Cecilia, A., & Fiederle, M. (2021). Characterization of Structural Defects in (Cd,Zn)Te Crystals Grown by the Travelling Heater Method. Crystals, 11(11), 1402. https://doi.org/10.3390/cryst11111402

Skład chemiczny, struktura i właściwości elektryczne grubych polikrystalicznych warstw CdZnTeSe. (2026). Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, 16(2), 126-130. https://doi.org/10.35784/iapgos.7435

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Numer Tom 16 Nr 2 (2026)

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