DETERMINATION OF THE STRUCTURAL STATE AND STABILITY OF THE LASER CRYSTALLIZED Cd1-xМnxTe CRYSTAL SURFACE


Abstract

The modified surface layers of the Cd1-xMnxTe crystals were obtained by the laser recrystallization of the crystal surface with the use of millisecond and nanosecond ruby ​​lasers. The determination and diagnostics of the layer structural state were performed by the study the electron channeling patterns in the SEM. The AFM studies showed that mechanically stable contact regions in the CdTe crystal – Cu film system can be formed, depending on the laser energy density and beam defocusing. On the base of the ellipsometric studies, it was found that while irradiating the Cd1-xMnxTe crystal surface, the refractive index of the oxide film on the modified surface changes depending on the laser beam energy density, which can be interpreted as the formation of the oxides of the different chemical composition.


Keywords

Cd1-xMnxTe crystal; surface; laser; thin film

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Published : 2020-03-30


Strebezhev, V., Yuriychuk, I., Fochuk, P., Nichyi, S., Dobrovolsky, Y., Tkachuk, V., Sorokatyi, M., & Sorokatyi, Y. (2020). DETERMINATION OF THE STRUCTURAL STATE AND STABILITY OF THE LASER CRYSTALLIZED Cd1-xМnxTe CRYSTAL SURFACE. Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska, 10(1), 40-43. https://doi.org/10.35784/iapgos.918

Victor Strebezhev 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0001-6127-656X
Ivan Yuriychuk  i.yuriychuk@chnu.edu.ua
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0001-6475-8337
Petro Fochuk 
Yuriy Fedkovych Chernivtsi National University, Institute of Biology, Chemistry and Bioresources, Department of General Chemistry and Chemical Material Science  Ukraine
http://orcid.org/0000-0002-4149-4882
Sergiy Nichyi 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0003-2662-9694
Yuriy Dobrovolsky 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0002-1248-3615
Victoria Tkachuk 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0002-4265-194X
Mykola Sorokatyi 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0001-6602-5698
Yurii Sorokatyi 
Yuriy Fedkovych Chernivtsi National University, Physical, Technical and Computer Science Institute, Department of Physics of Semiconductors and Nanostructures  Ukraine
http://orcid.org/0000-0001-9462-775X